Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photo emission spectroscopy

Petravic, M; Peter, R; Fan, L J; Yang, Y W; Chen, Ying (Ian)

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Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photo emission spectroscopy

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posted on 2010-07-01, 00:00 authored by M Petravic, R Peter, L J Fan, Y W Yang, Ying (Ian) ChenYing (Ian) Chen

Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photo emission spectroscopy

History

Journal

Nuclear instruments and methods in physics research section A

Volume

619

Issue

1-3

Pagination

94 - 97

Publisher

Elsevier Science BV

Location

Amsterdam, Netherlands

Publisher DOI

https://doi.org/10.1016/j.nima.2009.10.118

ISSN

0168-9002

eISSN

1872-9584

Language

eng

Publication classification

C1 Refereed article in a scholarly journal

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Keywords

Science & Technology Technology Physical Sciences Instruments & Instrumentation Nuclear Science & Technology Physics, Nuclear Physics, Particles & Fields Physics Boron nitride Nitrogen vacancy NEXAFS XPS Ion bombardment MOLECULAR NITROGEN BN PHOTOABSORPTION GAN

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File(s) under permanent embargo

Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photo emission spectroscopy

History

Journal

Volume

Issue

Pagination

Publisher

Location

Publisher DOI

ISSN

eISSN

Language

Publication classification

Copyright notice

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Keywords

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