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Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photo emission spectroscopy

journal contribution
posted on 2010-07-01, 00:00 authored by M Petravic, R Peter, L J Fan, Y W Yang, Ying (Ian) ChenYing (Ian) Chen
Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photo emission spectroscopy

History

Journal

Nuclear instruments and methods in physics research section A

Volume

619

Issue

1-3

Pagination

94 - 97

Publisher

Elsevier Science BV

Location

Amsterdam, Netherlands

Publisher DOI

ISSN

0168-9002

eISSN

1872-9584

Language

eng

Publication classification

C1 Refereed article in a scholarly journal

Copyright notice

2009, Elsevier B.V. All rights reserved.

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Direct observation of defects in hexagonal boron nitride by near-edge X-ray absorption fine structure and X-ray photo emission spectroscopy
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Keywords

Science & TechnologyTechnologyPhysical SciencesInstruments & InstrumentationNuclear Science & TechnologyPhysics, NuclearPhysics, Particles & FieldsPhysicsBoron nitrideNitrogen vacancyNEXAFSXPSIon bombardmentMOLECULAR NITROGENBNPHOTOABSORPTIONGAN

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