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EXAFS and XRD studies of nanocrystalline cerium oxide: the effect of preparation method on the microstructure

journal contribution
posted on 2007-01-01, 00:00 authored by S Savin, A Chadwick, M Smith, L O’Dell
EXAFS and XRD studies of nanocrystalline cerium oxide: the effect of preparation method on the microstructure

History

Journal

Physica status solidi C

Volume

4

Issue

3

Pagination

719 - 722

Publisher

Wiley - V C H Verlag GmbH & Co. KGaA

Location

Weinheim, Germany

Publisher DOI

ISSN

1862-6351

eISSN

1610-1642

Language

eng

Publication classification

C1.1 Refereed article in a scholarly journal

Copyright notice

2007, Wiley

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    Research Publications

    Categories

    Keywords

    nanocrystallineionic conductivitymicrostructuresol-gelball-millingXRD and EXAFS studiesScience & TechnologyTechnologyPhysical SciencesMaterials Science, MultidisciplinaryPhysics, Condensed MatterMaterials SciencePhysicsX-RAYQuantum MechanicsCondensed Matter Physics

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    All Rights Reserved

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