EXVUL: Towards Effective and Explainable Vulnerability Detection for IoT Devices

journal contribution

posted on 2025-02-25, 05:51 authored by S Cao, X Sun, W Liu, D Wu, J Zhang, Y Li, TH Luan, Longxiang GaoLongxiang Gao

EXVUL: Towards Effective and Explainable Vulnerability Detection for IoT Devices

History

Journal

IEEE Internet of Things Journal

Volume

11

Pagination

22385-22398

Location

Piscataway, NJ.

Open access

No

ISSN

2327-4662

eISSN

2327-4662

Language

eng

Notes

In press

Publication classification

C1.1 Refereed article in a scholarly journal

Issue

12

Publisher

IEEE

Publication URL

http://doi.org/10.1109/JIOT.2024.3381641

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All Rights Reserved

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