Enhancing line-level defect prediction using bilinear attention fusion and ranking optimization

Qiu, S; Huang, H; Kuang, Y; Luo, H; Liu, Xiao

Enhancing line-level defect prediction using bilinear attention fusion and ranking optimization

journal contribution

posted on 2025-06-23, 00:07 authored by S Qiu, H Huang, Y Kuang, H Luo, Xiao LiuXiao Liu

Enhancing line-level defect prediction using bilinear attention fusion and ranking optimization

History

Journal

Empirical Software Engineering

Volume

30

Article number

116

Pagination

1-34

Location

Berlin, Germany

Open access

No

ISSN

1382-3256

eISSN

1573-7616

Language

eng

Publication classification

C1 Refereed article in a scholarly journal

Issue

5

Publisher

Springer

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Enhancing line-level defect prediction using bilinear attention fusion and ranking optimization

History

Journal

Volume

Article number

Pagination

Location

Open access

ISSN

eISSN

Language

Publication classification

Issue

Publisher

Usage metrics

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Keywords

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