Estimation of photo-degradation of dielectrics surrounding the narrow channel due to PD activity

https://hdl.handle.net/10779/DRO/DU:30412465

journal contribution

posted on 2025-10-22, 04:15 authored by AA Ganjovi

Estimation of photo-degradation of dielectrics surrounding the narrow channel due to PD activity

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DOI - Is version of https://doi.org/10.1007/s40094-014-0144-6

Open access

Yes

Language

eng

Journal

Journal of Theoretical and Applied Physics

Volume

8

Pagination

147-168

ISSN

2251-7227

eISSN

2251-7235

Issue

4

Publisher

Springer

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Categories

Keywords

Dielectric degradation ELECTRICAL BREAKDOWN EPOXY GAP LIGHT-EMISSION MODEL PARTIAL DISCHARGES Physical Sciences Physics Physics, Applied PIC-MCC simulation PROGRAM PROPAGATION Radiation transport model Science & Technology SIMULATED TREE CHANNELS Spark-type partial discharge

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