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Exponentially weighted control charts to monitor multivariate process variability for high dimensions
journal contribution
posted on 2017-01-01, 00:00 authored by N G T Gunaratne, M A Abdollahian, Shamsul HudaShamsul Huda, John YearwoodJohn YearwoodMultivariate monitoring of industrial or clinical procedures often involves more than three correlated quality characteristics and the status of the process is judged using a sample of size one. Majority of existing control charts for monitoring process variability for individual observations are capable of monitoring up to three characteristics. One of the hurdles in designing optimal control charts for large dimension data is the enormous computing resources and time that is required by simulation algorithm to estimate the charts parameters. This paper proposes a novel algorithm based on Parallelised Monte Carlo simulation to improve the ability of the Multivariate Exponentially Weighted Mean Squared Deviation and Multivariate Exponentially Weighted Moving Variance charts to monitor process variability for high dimensions in a computationally efficient way. Different techniques have been deployed to reduce computing space and execution time. The optimal control limits (L) to detect small, medium and large shifts in the covariance matrix of up to 15 characteristics are provided. Furthermore, utilising the large number of optimal L values generated by the algorithm enabled authors to develop exponential decay functions to predict L values. This eliminates the need for further execution of the parallelised Monte Carlo simulation.
History
Journal
International journal of production researchVolume
55Issue
17Pagination
4948 - 4962Publisher
Taylor & FrancisLocation
Abingdon, Eng.Publisher DOI
ISSN
0020-7543eISSN
1366-588XLanguage
engPublication classification
C Journal article; C1 Refereed article in a scholarly journalCopyright notice
2017, Informa UKUsage metrics
Keywords
multivariate variabilityparallel Monte Carlo simulationexponential decay functionindividual observationsMEWMSMEWMVScience & TechnologyTechnologyEngineering, IndustrialEngineering, ManufacturingOperations Research & Management ScienceEngineeringVARIABLE SAMPLE-SIZEFUSIONComputation Theory and MathematicsData Format