Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes
Version 2 2024-06-03, 13:30
Version 1 2007-02-26, 00:00
journal contribution
posted on 2024-06-03, 13:30 authored by Ying (Ian) ChenYing (Ian) Chen, H Chen, J Yu, JS Williams, V CraigFocused ion beam milling as a universal template technique for patterned growth of carbon nanotubes
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CN.1 Other journal articleJournal
Applied Physics LettersVolume
90Pagination
093126-093126ISSN
0003-6951eISSN
1077-3118Issue
9Publisher
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