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Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes

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journal contribution
posted on 07.05.2007, 00:00 authored by Ying (Ian) ChenYing (Ian) Chen, Hua Chen, J Yu, J Williams, V Craig
Focused ion beam (FIB) milling system has been used to create nanosized patterns as the template for patterned growth of carbon nanotubes on Si substrate surface without predeposition of metal catalysts. Carbon nanotubes only nucleate and grow on the template under controlled pyrolysis of iron phthalocyanine at 1000 °C. The size, growth direction, and density of the patterned nanotubes can be controlled under different growth conditions and template sizes. Atomic force microscopy and electron microscopy analyses reveal that the selective growth on the FIB template is due to its special surface morphology and crystalline structure.

History

Journal

Applied physics letters

Volume

90

Issue

9

Pagination

1 - 3

Publisher

American Institute of Physics

Location

New York, N.Y.

ISSN

0003-6951

eISSN

1077-3118

Language

eng

Notes

This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Chen, Ying, Chen, Hua, Yu, Jun, Williams, James S. and Craig, Vince 2007-05-07, Focused ion beam milling as a universal template technique for patterned growth of carbon nanotubes, Applied physics letters, vol. 90, no. 9, pp. 093126-1-093126-3, and may be found at http://dx.doi.org/10.1063/1.2710785.

Publication classification

C1.1 Refereed article in a scholarly journal; C Journal article

Copyright notice

2007, American Institute of Physics.