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Haptics enabled of ine AFM image analysis

Version 2 2024-06-04, 02:16
Version 1 2015-03-17, 15:07
journal contribution
posted on 2024-06-04, 02:16 authored by Asim BhattiAsim Bhatti, S Nahavandi, M Hossny
Current advancements in nanotechnology are dependent on the capabilities that can enable nano-scientists to extend their eyes and hands into the nano-world. For this purpose, a haptics (devices capable of recreating tactile or force sensations) based system for AFM (Atomic Force Microscope) is proposed. The system enables the nano-scientists to touch and feel the sample surfaces, viewed through AFM, in order to provide them with better understanding of the physical properties of the surface, such as roughness, stiffness and shape of molecular architecture. At this stage, the proposed work uses of ine images produced using AFM and perform image analysis to create virtual surfaces suitable for haptics force analysis. The research work is in the process of extension from of ine to online process where interaction will be done directly on the material surface for realistic analysis. © 2009 WASET.ORG.

History

Journal

World Academy of Science, Engineering and Technology

Volume

37

Pagination

646-651

ISSN

2010-376X

eISSN

2010-3778

Language

eng

Publication classification

CN.1 Other journal article

Publisher

World Academy of Science, Engineering and Technology (WASET)

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