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High-dimensional and large-scale anomaly detection using a linear one-class SVM with deep learning
journal contribution
posted on 2016-10-01, 00:00 authored by S M Erfani, Sutharshan RajasegararSutharshan Rajasegarar, S Karunasekera, C LeckieHigh-dimensional problem domains pose significant challenges for anomaly detection. The presence of irrelevant features can conceal the presence of anomalies. This problem, known as the '. curse of dimensionality', is an obstacle for many anomaly detection techniques. Building a robust anomaly detection model for use in high-dimensional spaces requires the combination of an unsupervised feature extractor and an anomaly detector. While one-class support vector machines are effective at producing decision surfaces from well-behaved feature vectors, they can be inefficient at modelling the variation in large, high-dimensional datasets. Architectures such as deep belief networks (DBNs) are a promising technique for learning robust features. We present a hybrid model where an unsupervised DBN is trained to extract generic underlying features, and a one-class SVM is trained from the features learned by the DBN. Since a linear kernel can be substituted for nonlinear ones in our hybrid model without loss of accuracy, our model is scalable and computationally efficient. The experimental results show that our proposed model yields comparable anomaly detection performance with a deep autoencoder, while reducing its training and testing time by a factor of 3 and 1000, respectively.
History
Journal
Pattern recognitionVolume
58Pagination
121 - 134Publisher
ElsevierLocation
Amsterdam, The NetherlandsPublisher DOI
ISSN
0031-3203Language
engPublication classification
C Journal article; C1.1 Refereed article in a scholarly journalCopyright notice
2016, ElsevierUsage metrics
Categories
Keywords
anomaly detectionoutlier detectionhigh-dimensional datadeep belief netdeep learningone-class SVMfeature extractionScience & TechnologyTechnologyComputer Science, Artificial IntelligenceEngineering, Electrical & ElectronicComputer ScienceEngineeringSUPPORT VECTOR MACHINESFEATURE-SELECTIONCLASSIFICATIONDIAGNOSISInformation SystemsArtificial Intelligence and Image Processing
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