Imaging ion-bombarded III-V semiconductor surfaces: A scanning tunnelling microscopy study of InSb(100)

Schweitzer, MO; Leibsle, FM; Jones, TS; McConville, CF; Richardson, NV

Imaging ion-bombarded III-V semiconductor surfaces: A scanning tunnelling microscopy study of InSb(100)

Version 2 2024-06-18, 23:06

Version 1 2020-09-17, 14:58

journal contribution

posted on 2024-06-18, 23:06 authored by MO Schweitzer, FM Leibsle, TS Jones, CF McConville, NV Richardson

Imaging ion-bombarded III-V semiconductor surfaces: A scanning tunnelling microscopy study of InSb(100)

History

Journal

Semiconductor Science and Technology

Volume

8

Pagination

S342-S344

Location

SOUTHAMPTON, ENGLAND

Publisher DOI

https://doi.org/10.1088/0268-1242/8/1S/076

ISSN

0268-1242

eISSN

1361-6641

Language

English

Author URL

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1993KM53500077&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a045e4b2bb1f2b747c68c720ec8913b7

Publication classification

C1 Refereed article in a scholarly journal

Issue

1S

Publisher

IOP PUBLISHING LTD

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Keywords

Science & Technology Technology Physical Sciences Engineering, Electrical & Electronic Materials Science, Multidisciplinary Physics, Condensed Matter Engineering Materials Science Physics DAMAGE

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Imaging ion-bombarded III-V semiconductor surfaces: A scanning tunnelling microscopy study of InSb(100)

History

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Volume

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eISSN

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Author URL

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