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Improving security level of LTE access procedure by using short-life shared key

journal contribution
posted on 2017-05-01, 00:00 authored by F Ahmad, M Peradilla, Akanksha Saini, Y Jung
Improving security level of LTE access procedure by using short-life shared key

History

Journal

IEICE Transactions on Communications

Volume

E100B

Issue

5

Pagination

738 - 748

Publisher

Institute of Electronics, Information and Communication Engineers

Location

Tokyo, Japan

Publisher DOI

ISSN

0916-8516

eISSN

1745-1345

Language

eng

Author URL

Publication classification

C1.1 Refereed article in a scholarly journal

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Improving security level of LTE access procedure by using short-life shared key
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Categories

Keywords

Science & TechnologyTechnologyEngineering, Electrical & ElectronicTelecommunicationsEngineeringAuthentication and Key Agreementone-time shared keyLTE access procedureDenial-of-Service (DoS) attackIMSI and RAND privacyAUTHENTICATION

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