Improving security level of LTE access procedure by using short-life shared key

Ahmad, F; Peradilla, M; Saini, Akanksha; Jung, Y

Improving security level of LTE access procedure by using short-life shared key

Version 2 2024-06-19, 02:06

Version 1 2021-03-31, 08:16

journal contribution

posted on 2017-05-01, 00:00 authored by F Ahmad, M Peradilla, Akanksha Saini, Y Jung

Improving security level of LTE access procedure by using short-life shared key

History

Journal

IEICE Transactions on Communications

Volume

E100B

Issue

5

Pagination

738 - 748

Publisher

Institute of Electronics, Information and Communication Engineers

Location

Tokyo, Japan

Publisher DOI

https://doi.org/10.1587/transcom.2016EBP3267

ISSN

0916-8516

eISSN

1745-1345

Language

eng

Author URL

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000400679600007&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a045e4b2bb1f2b747c68c720ec8913b7

Publication classification

C1.1 Refereed article in a scholarly journal

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Keywords

Science & Technology Technology Engineering, Electrical & Electronic Telecommunications Engineering Authentication and Key Agreement one-time shared key LTE access procedure Denial-of-Service (DoS) attack IMSI and RAND privacy AUTHENTICATION

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Improving security level of LTE access procedure by using short-life shared key

History

Journal

Volume

Issue

Pagination

Publisher

Location

Publisher DOI

ISSN

eISSN

Language

Author URL

Publication classification

Usage metrics

Categories

Keywords

Licence

Exports