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In-situ studies of X-ray diffraction line profiles from strained copper foils
journal contribution
posted on 2001-01-01, 00:00 authored by R Cheary, C Tang, Peter LynchPeter Lynch, M Roberts, S ClarkThe development of an in-situ tensometer is described along with preliminary results of x-ray line profiles from copper foils under tensile stress. The tensometer was designed and constructed on the high resolution diffraction instrument, Station 2.3 at the synchrotron radiation source (SRS) Daresbury Laboratory, and is capable of collecting data in either symmetric or asymmetric geometry including transmission and reflection modes. Experiments were carried out using 18 J..Lm thick copper foil up to strain levels of 5 % using both symmetric reflection and symmetric transmission diffraction. All profiles displayed diffraction broadening and asymmetry which increased with strain. In addition, the asymmetry observed in symmetric transmission was associated with extended tails on the low angle side of the profiles, but in symmetric reflection data the opposite asymmetry was observed. In the analysis, the measured profiles were fitted using the software TOPAS, a fundamental parameters approach to profile fitting. The instrumental profile function was characterised and modelled using annealed LaB6 powder. The diffraction broadening was then determined by refining the convolution of a Voigt function, an asymmetric exponential function and a fixed instrument function to reproduce the observed broadened profiles. The integral breadth and asymmetry results display a strong order dependence and increase almost linearly with strain. The results were interpreted by assuming crystallite size broadening in combination with dislocation broadening arising from fcc a/2( 110) {Ill } dislocations.
History
Journal
Materials science forumVolume
378-381Pagination
254 - 261Publisher
Trans Tech PublicationsLocation
Stafa-Zurich, SwitzerlandISSN
0255-5476Language
engNotes
This paper was presented at the 7th European Powder Diffraction Conference; Barcelona; Spain; 20 May 2000 through 23 May 2000Publication classification
C1.1 Refereed article in a scholarly journalCopyright notice
2001, Trans Tech PublicationsUsage metrics
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