InN/GaN valence band offset: High-resolution x-ray photoemission spectroscopy measurements
Version 2 2024-06-13, 02:43Version 2 2024-06-13, 02:43
Version 1 2020-09-22, 15:31Version 1 2020-09-22, 15:31
journal contribution
posted on 2024-06-13, 02:43 authored by PDC King, TD Veal, CE Kendrick, LR Bailey, SM Durbin, CF McConvilleInN/GaN valence band offset: High-resolution x-ray photoemission spectroscopy measurements
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Journal
Physical Review B - Condensed Matter and Materials PhysicsVolume
78Article number
ARTN 033308Publisher DOI
ISSN
1098-0121eISSN
1550-235XLanguage
EnglishPublication classification
C1 Refereed article in a scholarly journalIssue
3Publisher
AMER PHYSICAL SOCUsage metrics
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