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Investigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy
journal contribution
posted on 2000-01-01, 00:00 authored by D Salina, R Cheary, P Swift, S Dligatch, G McCredie, B Gong, Peter LynchPeter LynchInvestigation of the interfacial structure of ultra-thin platinum films using X-ray reflectivity and X-ray photoelectron spectroscopy
History
Journal
Thin solid filmsVolume
372Issue
1 to 2Pagination
94 - 103Publisher
ElsevierLocation
Amsterdam, The NetherlandsPublisher DOI
ISSN
0040-6090eISSN
1879-2731Language
engPublication classification
C1.1 Refereed article in a scholarly journalCopyright notice
2000, ElsevierUsage metrics
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