File(s) not publicly available
Investigation on H-containing shallow trap of hydrogenated TiO2 with in situ Fourier transform infrared diffuse reflection spectroscopy
Version 2 2024-06-03, 02:07
Version 1 2023-12-04, 04:24
journal contribution
posted on 2024-06-03, 02:07 authored by Han BingHan Bing, Yun Hang HuInvestigation on H-containing shallow trap of hydrogenated TiO2 with in situ Fourier transform infrared diffuse reflection spectroscopy
History
Journal
NanotechnologyVolume
28Article number
304001Pagination
1-8Location
Bristol, Eng.Publisher DOI
ISSN
0957-4484eISSN
1361-6528Language
engPublication classification
C1.1 Refereed article in a scholarly journalIssue
30Publisher
IOP PublishingUsage metrics
Keywords
ABSORPTION-SPECTROSCOPYBLACK TIO2CONDUCTION-BAND ELECTRONSH-containing shallow trapHIGHLY EFFICIENTinfrared diffuse reflection spectroscopyIR SPECTROSCOPYMaterials ScienceMaterials Science, MultidisciplinaryNanoscience & NanotechnologyNANOTUBE ARRAYSphotocatalystPHOTOCATALYTIC ACTIVITYPHOTOGENERATED ELECTRONSPhysical SciencesPhysicsPhysics, AppliedScience & TechnologyScience & Technology - Other TopicsSOLAR-CELLSTechnologyTiO2TITANIUM-DIOXIDE
Licence
Exports
RefWorks
BibTeX
Ref. manager
Endnote
DataCite
NLM
DC