Investigation on H-containing shallow trap of hydrogenated TiO<sub>2</sub> with <i>in</i> <i>situ</i> Fourier transform infrared diffuse reflection spectroscopy
Version 2 2024-06-03, 02:07
Version 1 2023-12-04, 04:24
journal contribution
posted on 2024-06-03, 02:07 authored by Han Bing, Yun Hang HuInvestigation on H-containing shallow trap of hydrogenated TiO<sub>2</sub> with <i>in</i> <i>situ</i> Fourier transform infrared diffuse reflection spectroscopy
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Bristol, Eng.Language
engPublication classification
C1.1 Refereed article in a scholarly journalJournal
NanotechnologyVolume
28Article number
304001Pagination
1-8ISSN
0957-4484eISSN
1361-6528Issue
30Publisher
IOP PublishingPublication URL
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Keywords
ABSORPTION-SPECTROSCOPYBLACK TIO2CONDUCTION-BAND ELECTRONSH-containing shallow trapHIGHLY EFFICIENTinfrared diffuse reflection spectroscopyIR SPECTROSCOPYMaterials ScienceMaterials Science, MultidisciplinaryNanoscience & NanotechnologyNANOTUBE ARRAYSphotocatalystPHOTOCATALYTIC ACTIVITYPHOTOGENERATED ELECTRONSPhysical SciencesPhysicsPhysics, AppliedScience & TechnologyScience & Technology - Other TopicsSOLAR-CELLSTechnologyTiO2TITANIUM-DIOXIDE
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