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Ion-Induced Bending with Applications for High-Resolution Electron Imaging of Nanometer-Sized Samples
Version 2 2024-06-06, 03:06
Version 1 2021-11-11, 10:57
journal contribution
posted on 2024-06-06, 03:06 authored by S Zhang, V Garg, G Gervinskas, Ross MarceauRoss Marceau, E Chen, RG Mote, J FuIon-Induced Bending with Applications for High-Resolution Electron Imaging of Nanometer-Sized Samples
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Journal
ACS Applied Nano MaterialsVolume
4Pagination
12745-12754Location
Washington, D.C.Publisher DOI
ISSN
2574-0970eISSN
2574-0970Language
EnglishPublication classification
C1 Refereed article in a scholarly journalIssue
11Publisher
AMER CHEMICAL SOCUsage metrics
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No categories selectedKeywords
Science & TechnologyTechnologyNanoscience & NanotechnologyMaterials Science, MultidisciplinaryScience & Technology - Other TopicsMaterials Scienceion-induced bending (IIB)transmission electron microscopy (TEM)atom probe tomography (APT)sample preparationfocused ion beam (FIB)cryogenic temperaturenanoparticlesATOM-PROBE TOMOGRAPHYFIB LIFT-OUTSPECIMEN PREPARATIONNANOPARTICLESNANOSTRUCTURESFABRICATIONINTERFACESSCIENCE100712 Nanoscale Characterisation
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