Making DeepFakes More Spurious: Evading Deep Face Forgery Detection via Trace Removal Attack
journal contribution
posted on 2023-08-24, 05:40 authored by C Liu, H Chen, T Zhu, Jun Zhang, W ZhouMaking DeepFakes More Spurious: Evading Deep Face Forgery Detection via Trace Removal Attack
History
Related Materials
- 1.
Location
Piscataway, N.J.Language
engJournal
IEEE Transactions on Dependable and Secure ComputingVolume
PPPagination
1-15ISSN
1545-5971eISSN
1941-0018Issue
99Publisher
IEEEPublication URL
Usage metrics
Categories
Keywords
Licence
Exports
RefWorksRefWorks
BibTeXBibTeX
Ref. managerRef. manager
EndnoteEndnote
DataCiteDataCite
NLMNLM
DCDC

