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Making DeepFakes More Spurious: Evading Deep Face Forgery Detection via Trace Removal Attack

journal contribution
posted on 2023-08-24, 05:40 authored by C Liu, H Chen, T Zhu, Jun Zhang, W Zhou
Making DeepFakes More Spurious: Evading Deep Face Forgery Detection via Trace Removal Attack

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Location

Piscataway, N.J.

Language

eng

Journal

IEEE Transactions on Dependable and Secure Computing

Volume

PP

Pagination

1-15

ISSN

1545-5971

eISSN

1941-0018

Issue

99

Publisher

IEEE

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