In this paper we described new technique for 1-D and 2-D edge feature extraction to subpixel accuracy using edge models and the local energy approach. A candidate edge is modeled as one of a number of parametric edge models, and the fit is refined by a least-squared error fitting technique.
History
Journal
IEEE transactions on pattern analysis and machine intelligence
Volume
16
Pagination
405 - 410
Location
Piscataway, N. J.
Open access
Yes
ISSN
0162-8828
eISSN
1939-3539
Language
eng
Notes
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