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Modeling edges at subpixel accuracy using the local energy approach

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journal contribution
posted on 1994-04-01, 00:00 authored by M Kisworo, Svetha VenkateshSvetha Venkatesh, G West
In this paper we described new technique for 1-D and 2-D edge feature extraction to subpixel accuracy using edge models and the local energy approach. A candidate edge is modeled as one of a number of parametric edge models, and the fit is refined by a least-squared error fitting technique.

History

Journal

IEEE transactions on pattern analysis and machine intelligence

Volume

16

Issue

4

Pagination

405 - 410

Publisher

IEEE

Location

Piscataway, N. J.

ISSN

0162-8828

eISSN

1939-3539

Language

eng

Notes

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Publication classification

C1.1 Refereed article in a scholarly journal

Copyright notice

1994, IEEE