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Molecular depth profiling of organic and biological materials
journal contribution
posted on 2006-07-30, 00:00 authored by J Fletcher, Xavier ConlanXavier Conlan, N Lockyer, J VickermanAtomic depth profiling using secondary ion mass spectrometry, SIMS, is common in the field micro-electronics; however, the generation of molecular information as a function of sample depth is difficult due to the accumulation of damage both on and beneath the sample surface. The introduction of polyatomic ion beams such as SF5 and C60 have raised the possibility of overcoming this problem as they deposit the majority of their energy in the upper surface of the sample resulting in increased sputter yields but with a complimentary reduction in sub-surface damage accumulation. In this paper we report the depth profile analysis of the bio-polymer polycaprolactone, PCL, using the polyatomic ions Au3+ and C60+ and the monoatomic Au+. Results are compared to recent analysis of a similar sample using . depth profiling of cellulose is also demonstrated, an experiment that has been reported as unsuccessful when attempted with implications for biological analysis are discussed.
History
Journal
Applied surface scienceVolume
252Issue
19Pagination
6513 - 6516Publisher
ElsevierLocation
Amsterdam, The NetherlandsPublisher DOI
ISSN
0169-4332eISSN
1873-5584Language
engPublication classification
C1.1 Refereed article in a scholarly journalCopyright notice
2006, Elsevier B.V.Usage metrics
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