li-nearfield-2019.pdf (1.34 MB)
Near-field IR orientational spectroscopy of silk
journal contribution
posted on 2019-01-01, 00:00 authored by M Ryu, R Honda, A Reich, A Cernescu, Jingliang LiJingliang Li, J Hu, S Juodkazis, J Morikawa© 2019 by the authors. Orientational dependence of the IR absorbing amide bands of silk is demonstrated from two orthogonal longitudinal and transverse microtome slices with a thickness of only ~100 nm. Scanning near-field optical microscopy (SNOM) which preferentially probes orientation perpendicular to the sample's surface was used. Spatial resolution of the silk-epoxy boundary was ~100 nm resolution, while the spectra were collected by a ~10 nm tip. Ratio of the absorbance of the amide-II C-N at 1512 cm-1 and amide-I C=O β-sheets at 1628 cm-11 showed sensitivity of SNOM to the molecular orientation. SNOM characterisation is complimentary to the far-field absorbance which is sensitive to the in-plane polarisation. Volumes with cross sections smaller than 100 nm can be characterised for molecular orientation. A method of absorbance measurements at four angles of the slice cut orientation, which is equivalent to the four polarisation angles absorbance measurement, is proposed.
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Journal
Applied Sciences (Switzerland)Volume
9Issue
19Pagination
1 - 8Publisher
MDPILocation
Basel, SwitzerlandPublisher DOI
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eISSN
2076-3417Language
engPublication classification
C Journal article; C1 Refereed article in a scholarly journalUsage metrics
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