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Optimal design of accelerated life tests for the Weibull distribution under periodic inspection and type I censoring

journal contribution
posted on 1994-01-01, 00:00 authored by A Islam, N Ahmad
Optimal design of accelerated life tests for the Weibull distribution under periodic inspection and type I censoring

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Journal

Microelectronics Reliability

Volume

34

Pagination

1459-1468

Publisher DOI

ISSN

0026-2714

Language

en

Publication classification

C1.1 Refereed article in a scholarly journal

Issue

9

Publisher

Elsevier BV

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    All Rights Reserved

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