Pulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry
Version 2 2024-06-06, 09:01
Version 1 2017-05-01, 00:00
journal contribution
posted on 2024-06-06, 09:01 authored by VR Adineh, Ross MarceauRoss Marceau, Y Chen, KJ Si, T Velkov, W Cheng, J Li, J FuPulsed-voltage atom probe tomography of low conductivity and insulator materials by application of ultrathin metallic coating on nanoscale specimen geometry
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Location
NetherlandsLanguage
EnglishPublication classification
C1 Refereed article in a scholarly journalCopyright notice
2017, ElsevierJournal
UltramicroscopyVolume
181Pagination
150-159ISSN
0304-3991eISSN
1879-2723Publisher
ELSEVIER SCIENCE BVUsage metrics
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Keywords
Science & TechnologyTechnologyMicroscopyAtom probe tomographyPhysical vapor depositionNanospheresELECTRIC-FIELDSTRESSES099999 Engineering not elsewhere classified970110 Expanding Knowledge in TechnologyInstitute for Frontier Materials4099 Other engineering4016 Materials engineering4018 Nanotechnology
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