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Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

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journal contribution
posted on 2016-02-16, 00:00 authored by Y Zhou, D S Fox, P Maguire, R O'Connell, R Masters, C Rodenburg, H Wu, M Dapor, Ying (Ian) ChenYing (Ian) Chen, H Zhang
Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

History

Journal

Scientific Reports

Volume

6

Issue

1

Article number

ARTN 21045

Publisher

NATURE PUBLISHING GROUP

Location

England

Publisher DOI

ISSN

2045-2322

eISSN

2045-2322

Language

English

Author URL

Publication classification

C Journal article; C1 Refereed article in a scholarly journal

Copyright notice

2016, The Authors

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    Keywords

    Science & TechnologyMultidisciplinary SciencesScience & Technology - Other Topics

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    All Rights Reserved

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