Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

Zhou, Y; Fox, DS; Maguire, P; O'Connell, R; Masters, R; Rodenburg, C; Wu, H; Dapor, M; Chen, Ying (Ian); Zhang, H

Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

https://hdl.handle.net/10536/DRO/DU:30083095
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posted on 2024-06-17, 17:42 authored by Y Zhou, DS Fox, P Maguire, R O'Connell, R Masters, C Rodenburg, H Wu, M Dapor, Ying (Ian) ChenYing (Ian) Chen, H Zhang

Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

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DOI - Is version of https://doi.org/10.1038/srep21045

Location

England

Open access

Yes

Language

English

Author URL

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000370297400001&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a045e4b2bb1f2b747c68c720ec8913b7

Publication classification

C Journal article, C1 Refereed article in a scholarly journal

Copyright notice

2016, Nature Publishing Group

Journal

Scientific Reports

Volume

6

Article number

ARTN 21045

ISSN

2045-2322

eISSN

2045-2322

Issue

1

Publisher

NATURE PUBLISHING GROUP

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Keywords

Science & Technology Multidisciplinary Sciences Science & Technology - Other Topics 100708 Nanomaterials Institute for Frontier Materials 970110 Expanding Knowledge in Technology MD Multidisciplinary 4018 Nanotechnology

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CC BY 4.0

Quantitative secondary electron imaging for work function extraction at atomic level and layer identification of graphene

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Related Materials

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Open access

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eISSN

Issue

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