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Resistive coupling efficiency criterion for evaluating substrate shielding structures of transformers

Version 2 2024-06-13, 09:34
Version 1 2016-10-10, 12:31
journal contribution
posted on 2024-06-13, 09:34 authored by J Shi, YZ Xiong, J Brinkhoff, A Issaoun, F Lin
This letter presents a new way to evaluate the transformer substrate effect by computing its resistive coupling efficiency coefficient ηKr. To assess η Kr, a set of transformers with and without shielding structures was fabricated using standard 0.18-μmCMOS process. The resistive coupling factor K r and efficiency ηKr were extracted. It was found that substrate and shielding effects are better quantified with ηK r than with G max and S parameters. The larger the relative shielding dimensions, the higher the ηK r is. With ηK r as a figure of merit, we see clearly that a large 3-D patterned floating shield improves transformer performance more than a 2-D one. It was also found that shielding efficiency is correlated with shielding structure dimensions and that the performance of shielded transformers is less sensitive to temperature variations.

History

Journal

IEEE Electron Device Letters

Volume

29

Pagination

114-117

Location

New York, N.Y.

ISSN

0741-3106

Language

eng

Publication classification

C1.1 Refereed article in a scholarly journal

Copyright notice

2008, IEEE

Issue

1

Publisher

Institute of Electrical and Electronics Engineers