Resistive coupling efficiency criterion for evaluating substrate shielding structures of transformers
Version 2 2024-06-13, 09:34Version 2 2024-06-13, 09:34
Version 1 2016-10-10, 12:31Version 1 2016-10-10, 12:31
journal contribution
posted on 2024-06-13, 09:34authored byJ Shi, YZ Xiong, J Brinkhoff, A Issaoun, F Lin
This letter presents a new way to evaluate the transformer substrate effect by computing its resistive coupling efficiency coefficient ηKr. To assess η Kr, a set of transformers with and without shielding structures was fabricated using standard 0.18-μmCMOS process. The resistive coupling factor K r and efficiency ηKr were extracted. It was found that substrate and shielding effects are better quantified with ηK r than with G max and S parameters. The larger the relative shielding dimensions, the higher the ηK r is. With ηK r as a figure of merit, we see clearly that a large 3-D patterned floating shield improves transformer performance more than a 2-D one. It was also found that shielding efficiency is correlated with shielding structure dimensions and that the performance of shielded transformers is less sensitive to temperature variations.