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Park, Jihong; Samarakoon, S; Bennis, M; Debbah, M; Conti, A; Mazuelas, S; Bartoletti, S; Lindsey, WC; Win, MZ; Zhang, Y; Mao, J; Grant, PM; Thompson, JS

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posted on 2024-07-26, 02:22 authored by Jihong ParkJihong Park, S Samarakoon, M Bennis, M Debbah, A Conti, S Mazuelas, S Bartoletti, WC Lindsey, MZ Win, Y Zhang, J Mao, PM Grant, JS Thompson

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DOI - Is version of https://doi.org/10.1109/jproc.2019.2946408

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Proceedings of the IEEE

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107

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2202-2203

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0018-9219

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1558-2256

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11

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Institute of Electrical and Electronics Engineers (IEEE)

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http://dx.doi.org/10.1109/jproc.2019.2946408

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