Simultaneous Interfacial Reactivity and Topography Mapping with Scanning Ion Conductance Microscopy
Version 2 2024-06-05, 09:39
Version 1 2021-06-17, 09:10
journal contribution
posted on 2024-06-05, 09:39 authored by D Momotenko, K McKelvey, Minkyung KangMinkyung Kang, GN Meloni, PR UnwinSimultaneous Interfacial Reactivity and Topography Mapping with Scanning Ion Conductance Microscopy
History
Journal
Analytical ChemistryVolume
88Pagination
2838-2846Location
Washington, DCISSN
0003-2700eISSN
1520-6882Language
EnglishPublication classification
C1.1 Refereed article in a scholarly journalIssue
5Publisher
American Chemical SocietyUsage metrics
Categories
Keywords
ChemistryChemistry, AnalyticalCURRENT RECTIFICATIONELECTROCHEMICAL MICROSCOPYMEMBRANESOPTICAL MICROSCOPYPhysical SciencesPROBERESOLUTIONScience & TechnologySECMSURFACE-CHARGETIPULTRAMICROELECTRODEEuropean Research Council through Project ERC-2009 AdG 247143-QUANTIFMarie Curie IntraEuropean Fellowship 626158 FUNICIS3401 Analytical chemistry3499 Other chemical sciences3406 Physical chemistry
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