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Simultaneous Interfacial Reactivity and Topography Mapping with Scanning Ion Conductance Microscopy
journal contribution
posted on 2016-01-22, 00:00 authored by D Momotenko, K McKelvey, Minkyung Kang, G N Meloni, P R UnwinSimultaneous Interfacial Reactivity and Topography Mapping with Scanning Ion Conductance Microscopy
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Journal
Analytical ChemistryVolume
88Issue
5Pagination
2838 - 2846Publisher
American Chemical SocietyLocation
Washington, DCPublisher DOI
ISSN
0003-2700eISSN
1520-6882Language
EnglishPublication classification
C1.1 Refereed article in a scholarly journalUsage metrics
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