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Smooth Surface Defect Detection by Deep Learning Based on Wrapped Phase Map
journal contribution
posted on 2021-07-15, 00:00 authored by J Tao, Y Zhu, W Liu, F Jiang, H LiuSmooth Surface Defect Detection by Deep Learning Based on Wrapped Phase Map
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Journal
IEEE Sensors JournalVolume
21Pagination
16236-16244Publisher DOI
ISSN
1530-437XeISSN
1558-1748Publication classification
C1 Refereed article in a scholarly journalIssue
14Publisher
Institute of Electrical and Electronics Engineers (IEEE)Usage metrics
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