Smooth Surface Defect Detection by Deep Learning Based on Wrapped Phase Map

journal contribution

posted on 2021-07-15, 00:00 authored by J Tao, Y Zhu, W Liu, F Jiang, H Liu

Smooth Surface Defect Detection by Deep Learning Based on Wrapped Phase Map

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Related Materials

1.
DOI - Is version of https://doi.org/10.1109/JSEN.2021.3076610

Publication classification

C1 Refereed article in a scholarly journal

Journal

IEEE Sensors Journal

Volume

21

Pagination

16236-16244

ISSN

1530-437X

eISSN

1558-1748

Issue

14

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

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Categories

Keywords

4008 Electrical engineering 4009 Electronics, sensors and digital hardware

Licence

All Rights Reserved

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