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Structural characterization of SiO2 and Al2O 3 zener-pinned nanocrystalline TiO2 by NMR, XRD and electron microscopy
journal contribution
posted on 2007-09-20, 00:00 authored by L O’Dell, S Savin, A Chadwick, M SmithStructural characterization of SiO2 and Al2O 3 zener-pinned nanocrystalline TiO2 by NMR, XRD and electron microscopy
History
Journal
Journal of physical chemistry CVolume
111Issue
37Pagination
13740 - 13746Publisher
American Chemical SocietyLocation
Washington, D.C.Publisher DOI
ISSN
1932-7447eISSN
1932-7455Language
engPublication classification
C1.1 Refereed article in a scholarly journalCopyright notice
2007, American Chemical SocietyUsage metrics
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No categories selectedKeywords
nanocrystallinesol-gelzener-pinnedsilicaaluminaelectron microscopynuclear magnetic resonancetitanium dioxideScience & TechnologyPhysical SciencesTechnologyChemistry, PhysicalNanoscience & NanotechnologyMaterials Science, MultidisciplinaryChemistryScience & Technology - Other TopicsMaterials ScienceO-17 NMRALUMINUM TITANATEPHASE-TRANSITIONTEMPERATURESIZEPARTICLESCERAMICSAL-27SI-29
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