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The evolution of preferred orientation and morphology of AlN films under various sputtering parameters
journal contribution
posted on 2023-11-03, 05:03 authored by Z Wei, L Shen, Y Kuang, J Wang, G Yang, Weiwei LeiWeiwei LeiThe evolution of preferred orientation and morphology of AlN films under various sputtering parameters
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Journal
Journal of Crystal GrowthVolume
625Article number
127439Pagination
1-7Location
Amsterdam, The NetherlandsPublisher DOI
ISSN
0022-0248Language
engPublication classification
C1 Refereed article in a scholarly journalPublisher
ElsevierUsage metrics
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