Time-of-flight medium energy ion scattering study of epitaxial Si/Si1-xGex superlattice structures

https://hdl.handle.net/10536/DRO/DU:30142270
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journal contribution

posted on 2024-06-18, 23:06 authored by CF McConville, TCQ Noakes, S Sugden, PK Hucknell, CJ Sofield

Time-of-flight medium energy ion scattering study of epitaxial Si/Si1-xGex superlattice structures

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Related Materials

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DOI - Is version of https://doi.org/10.1016/0168-583X(96)00260-1

Location

ARIZONA STATE UNIV CAMPUS, TEMPE, AZ

Language

English

Author URL

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:A1996VN26100109&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a045e4b2bb1f2b747c68c720ec8913b7

Publication classification

C1 Refereed article in a scholarly journal

Journal

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volume

118

Pagination

573-577

ISSN

0168-583X

Issue

1-4

Publisher

ELSEVIER SCIENCE BV