Time-of-flight secondary ion mass spectrometry analysis of conformational changes in adsorbed protein films

https://hdl.handle.net/10779/DRO/DU:26786746

journal contribution

posted on 2024-08-20, 05:37 authored by N Xia, CJ May, Sally McArthur, DG Castner

Time-of-flight secondary ion mass spectrometry analysis of conformational changes in adsorbed protein films

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1.
DOI - Is version of https://doi.org/10.1021/la020022u

Language

English

Publication classification

C1.1 Refereed article in a scholarly journal

Journal

Langmuir

Volume

18

Pagination

4090-4097

ISSN

0743-7463

eISSN

1520-5827

Issue

10

Publisher

AMER CHEMICAL SOC

Publication URL

http://dx.doi.org/10.1021/la020022u

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Keywords

Science & Technology Physical Sciences Technology Chemistry, Multidisciplinary Chemistry, Physical Materials Science, Multidisciplinary Chemistry Materials Science ATOMIC-FORCE MICROSCOPE IR SPECTROSCOPY TOF-SIMS ADSORPTION SURFACES FLUOROPOLYMERS INTERFERENCES ORIENTATION RECOGNITION MEMBRANES

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