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Time-resolved in situ synchrotron x-ray diffraction studies of type 1 silicon clathrate formation
journal contribution
posted on 2011-12-13, 00:00 authored by P Hutchins, O Leynaud, L O’Dell, M Smith, P Barnes, P McMillanTime-resolved in situ synchrotron x-ray diffraction studies of type 1 silicon clathrate formation
History
Journal
Chemistry of materialsVolume
23Issue
23Pagination
5160 - 5167Publisher
American Chemical SocietyLocation
Washington, D.C.Publisher DOI
ISSN
0897-4756eISSN
1520-5002Language
engPublication classification
C1.1 Refereed article in a scholarly journalCopyright notice
2011, American Chemical SocietyUsage metrics
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in situ studiesNa8Si46NaSiNMR spectroscopysilicon clathratesolid-state synthesissynchrotron radiationx-ray diffractionzintl phaseScience & TechnologyPhysical SciencesTechnologyChemistry, PhysicalMaterials Science, MultidisciplinaryChemistryMaterials ScienceTHERMAL-CONDUCTIVITYSUPERCONDUCTIVITYDECOMPOSITIONCANDIDATESCOMPOUNDPHASESGE
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