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Towards Multi-User, Secure, and Verifiable $k$NN Query in Cloud Database

journal contribution
posted on 2023-03-02, 05:22 authored by Ningning Cui, Kang Qian, Taotao Cai, Jianxin LiJianxin Li, Xiaochun Yang, Jie Cui, Hong Zhong
With the boom in cloud computing, data outsourcing in location-based services is proliferating and has attracted increasing interest from research communities and commercial applications. Nevertheless, since the cloud server is probably both untrusted and malicious, concerns about data security and result integrity have become on the rise sharply. In addition, in the single-user situation assumed by most existing works, query users can capture query content from each other even though the queries are encrypted, which may incur the leakage of query privacy. Unfortunately, there exists little work that can commendably assure data security and result integrity in the multi-user setting. To this end, in this paper, we study the problem of multi-user, secure, and verifiable $k$ nearest neighbor query (MSV $k$ NN). To support MSV $k$ NN, we first propose a novel unified structure, called verifiable and secure index (VSI). Based on this, we devise a series of secure protocols to facilitate query processing and develop a compact verification strategy. Given an MSV $k$ NN query, our proposed solution can not merely answer the query efficiently while can guarantee: 1) preserving data privacy, query privacy, result privacy, and access patterns privacy; 2) authenticating the correctness and completeness of the results; 3) supporting multi-user with different keys. Finally, the formal security analysis and complexity analysis are theoretically proven and the performance and feasibility of our proposed approach are empirically evaluated and demonstrated.

History

Journal

IEEE Transactions on Knowledge and Data Engineering

Volume

PP

Pagination

1-16

ISSN

1041-4347

eISSN

1558-2191

Publication classification

C1 Refereed article in a scholarly journal

Issue

99

Publisher

Institute of Electrical and Electronics Engineers (IEEE)

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