Valence band offset of the ZnO/AlN heterojunction determined by x-ray photoemission spectroscopy

Veal, T D; King, P D C; Hatfield, S A; Bailey, L R; McConville, Chris; Martel, B; Moreno, J C; Frayssinet, E; Semond, F; Zúñiga-Pérez, J

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Valence band offset of the ZnO/AlN heterojunction determined by x-ray photoemission spectroscopy

journal contribution

posted on 2008-12-02, 00:00 authored by T D Veal, P D C King, S A Hatfield, L R Bailey, Chris McConvilleChris McConville, B Martel, J C Moreno, E Frayssinet, F Semond, J Zúñiga-Pérez

Valence band offset of the ZnO/AlN heterojunction determined by x-ray photoemission spectroscopy

History

Journal

Applied Physics Letters

Volume

93

Issue

20

Article number

ARTN 202108

Publisher

AMER INST PHYSICS

Publisher DOI

https://doi.org/10.1063/1.3032911

ISSN

0003-6951

eISSN

1077-3118

Language

English

Author URL

http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcApp=PARTNER_APP&SrcAuth=LinksAMR&KeyUT=WOS:000261141400029&DestLinkType=FullRecord&DestApp=ALL_WOS&UsrCustomerID=a045e4b2bb1f2b747c68c720ec8913b7

Publication classification

C1 Refereed article in a scholarly journal

File(s) not publicly available

Valence band offset of the ZnO/AlN heterojunction determined by x-ray photoemission spectroscopy

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