Molecular depth profiling of organic and biological materials

Fletcher, John S., Conlan, Xavier A., Lockyer, Nicholas P. and Vickerman, John C. 2006, Molecular depth profiling of organic and biological materials, Applied surface science, vol. 252, no. 19, pp. 6513-6516, doi: 10.1016/j.apsusc.2006.02.213.

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Title Molecular depth profiling of organic and biological materials
Author(s) Fletcher, John S.
Conlan, Xavier A.ORCID iD for Conlan, Xavier A.
Lockyer, Nicholas P.
Vickerman, John C.
Journal name Applied surface science
Volume number 252
Issue number 19
Start page 6513
End page 6516
Publisher Elsevier
Place of publication Amsterdam, The Netherlands
Publication date 2006-07-30
ISSN 0169-4332
Summary Atomic depth profiling using secondary ion mass spectrometry, SIMS, is common in the field micro-electronics; however, the generation of molecular information as a function of sample depth is difficult due to the accumulation of damage both on and beneath the sample surface. The introduction of polyatomic ion beams such as SF5 and C60 have raised the possibility of overcoming this problem as they deposit the majority of their energy in the upper surface of the sample resulting in increased sputter yields but with a complimentary reduction in sub-surface damage accumulation. In this paper we report the depth profile analysis of the bio-polymer polycaprolactone, PCL, using the polyatomic ions Au3+ and C60+ and the monoatomic Au+. Results are compared to recent analysis of a similar sample using . depth profiling of cellulose is also demonstrated, an experiment that has been reported as unsuccessful when attempted with implications for biological analysis are discussed.
Language eng
DOI 10.1016/j.apsusc.2006.02.213
Field of Research 060101 Analytical Biochemistry
HERDC Research category C1.1 Refereed article in a scholarly journal
Copyright notice ©2006, Elsevier B.V.
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