Determining the dislocation contrast factor for x-ray line profile analysis Armstrong, N. and Lynch, P.A. 2003, Determining the dislocation contrast factor for x-ray line profile analysis. In Mittemeijer, E. J. and Scardi, P. (ed), Diffraction analysis of the microstructure of materials, Springer, Berlin, Germany, pp.249-285. Attached Files Name Description MIMEType Size Downloads Title Determining the dislocation contrast factor for x-ray line profile analysis Author(s) Armstrong, N. Lynch, P.A. Title of book Diffraction analysis of the microstructure of materials Editor(s) Mittemeijer, E. J. Scardi, P. Publication date 2003 Series Springer series in materials science, 0933-033X ; 68 Chapter number 1 Total chapters 1 Start page 249 End page 285 Total pages 37 Publisher Springer Place of Publication Berlin, Germany ISBN 03540405194 Language eng Field of Research 029999 Physical Sciences not elsewhere classified Socio Economic Objective 970102 Expanding Knowledge in the Physical Sciences HERDC Research category B1.1 Book chapter Copyright notice ©2003, Springer Persistent URL http://hdl.handle.net/10536/DRO/DU:30052434 Document type: Book Chapter Collection: Faculty of Health   Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved. Versions Version Filter Type Mon, 13 May 2013, 12:33:27 EST Mon, 13 May 2013, 12:59:41 EST Tue, 14 May 2013, 09:58:39 EST Wed, 27 Aug 2014, 23:28:49 EST Mon, 01 Dec 2014, 08:31:38 EST Filtered Full Citation counts:   Cited 0 times in TR Web of Science Cited 0 times in Scopus Search Google Scholar Access Statistics: 606 Abstract Views, 0 File Downloads  -  Detailed Statistics Created: Mon, 13 May 2013, 12:33:27 EST