A new methodology for retrieval of grain depth information from scanning polychromatic X-ray microdiffraction data
Lynch, P.A., Stevenson, A.W., Tomus, D., Bettles, C., Gibson, M. and Liang, D. 2009, A new methodology for retrieval of grain depth information from scanning polychromatic X-ray microdiffraction data, in SRI09 : Proceedings of the 10th International Conference on Synchrotron Radiation and Instrumentation, [The Conference], [Melbourne, Vic.].
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A new methodology for retrieval of grain depth information from scanning polychromatic X-ray microdiffraction data
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