Unsupervised classification of digital images using enhanced sensor pattern noise

Li, Chang-Tsun 2010, Unsupervised classification of digital images using enhanced sensor pattern noise, in ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems, IEEE,, pp. 3429-3432, doi: 10.1109/ISCAS.2010.5537850.

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Title Unsupervised classification of digital images using enhanced sensor pattern noise
Author(s) Li, Chang-TsunORCID iD for Li, Chang-Tsun orcid.org/0000-0003-4735-6138
Conference name International Symposium on Circuits and Systems Nano-Bio Circuit Fabrics and Systems (ISCAS 2010)
Conference location Paris, FRANCE
Conference dates 2010/05/30 - 2010/06/02
Title of proceedings ISCAS 2010 - 2010 IEEE International Symposium on Circuits and Systems: Nano-Bio Circuit Fabrics and Systems
Publication date 2010
Series IEEE International Symposium on Circuits and Systems
Start page 3429
End page 3432
Total pages 4
Publisher IEEE
Keyword(s) Science & Technology
Technology
Engineering, Electrical & Electronic
Engineering
Image classification
machine learning
digital forensics
sensor pattern noise
ISBN 9781424453085
ISSN 0271-4302
Language eng
DOI 10.1109/ISCAS.2010.5537850
Indigenous content off
HERDC Research category E1.1 Full written paper - refereed
Persistent URL http://hdl.handle.net/10536/DRO/DU:30125097

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