Improving security level of LTE access procedure by using short-life shared key

Ahmad, F, Peradilla, M, Saini, Akanksha and Jung, Y 2017, Improving security level of LTE access procedure by using short-life shared key, IEICE Transactions on Communications, vol. E100B, no. 5, pp. 738-748, doi: 10.1587/transcom.2016EBP3267.


Title Improving security level of LTE access procedure by using short-life shared key
Author(s) Ahmad, F
Peradilla, M
Saini, AkankshaORCID iD for Saini, Akanksha orcid.org/0000-0002-7191-2854
Jung, Y
Journal name IEICE Transactions on Communications
Volume number E100B
Issue number 5
Start page 738
End page 748
Total pages 11
Publisher Institute of Electronics, Information and Communication Engineers
Place of publication Tokyo, Japan
Publication date 2017-05-01
ISSN 0916-8516
1745-1345
Keyword(s) Science & Technology
Technology
Engineering, Electrical & Electronic
Telecommunications
Engineering
Authentication and Key Agreement
one-time shared key
LTE access procedure
Denial-of-Service (DoS) attack
IMSI and RAND privacy
AUTHENTICATION
Language eng
DOI 10.1587/transcom.2016EBP3267
Indigenous content off
Field of Research 0906 Electrical and Electronic Engineering
1005 Communications Technologies
HERDC Research category C1.1 Refereed article in a scholarly journal
Persistent URL http://hdl.handle.net/10536/DRO/DU:30149643

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