Characteristics of a dynamic atomic force microscopy based on a higher-order resonant silicon cantilever and experiments

Huang, Q, Zhao, Y, Yuan, Dan, Zhang, L and Cheng, Z 2016, Characteristics of a dynamic atomic force microscopy based on a higher-order resonant silicon cantilever and experiments, Measurement, vol. 94, pp. 31-36, doi: 10.1016/j.measurement.2016.07.081.

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Title Characteristics of a dynamic atomic force microscopy based on a higher-order resonant silicon cantilever and experiments
Author(s) Huang, Q
Zhao, Y
Yuan, Dan
Zhang, L
Cheng, Z
Journal name Measurement
Volume number 94
Start page 31
End page 36
Total pages 6
Publisher Elsevier
Place of publication Amsterdam, The Netherlands
Publication date 2016-12
ISSN 0263-2241
1873-412X
Keyword(s) AFM
Cantilever
Dynamic AFM
Engineering
Engineering, Multidisciplinary
Higher-order resonance
Instruments & Instrumentation
Scanning speed
Science & Technology
Sensitivity
Surface scanning
Technology
Language eng
DOI 10.1016/j.measurement.2016.07.081
Field of Research 0102 Applied Mathematics
0801 Artificial Intelligence and Image Processing
0913 Mechanical Engineering
HERDC Research category C1.1 Refereed article in a scholarly journal
Persistent URL http://hdl.handle.net/10536/DRO/DU:30154523

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