One-Pass Logistic Regression for Label-Drift and Large-Scale Classification on Distributed Systems Nguyen, V, Nguyen, TD, Le, T, Venkatesh, Svetha and Phung, D 2016, One-Pass Logistic Regression for Label-Drift and Large-Scale Classification on Distributed Systems, in 2016 IEEE 16th International Conference on Data Mining (ICDM), IEEE,, doi: 10.1109/icdm.2016.0145. Attached Files Name Description MIMEType Size Downloads Title One-Pass Logistic Regression for Label-Drift and Large-Scale Classification on Distributed Systems Author(s) Nguyen, V Nguyen, TD Le, T Venkatesh, Svetha orcid.org/0000-0001-8675-6631 Phung, D Conference name 2016 IEEE 16th International Conference on Data Mining (ICDM) Conference dates 2016/12/12 - 2016/12/15 Title of proceedings 2016 IEEE 16th International Conference on Data Mining (ICDM) Publication date 2016 Publisher IEEE DOI 10.1109/icdm.2016.0145 Indigenous content off HERDC Research category E1 Full written paper - refereed Persistent URL http://hdl.handle.net/10536/DRO/DU:30167687 Document type: Conference Paper Collection: A2I2 (Applied Artificial Intelligence Institute) Related Links Link Description Connect to published version Go to link with your DU access privileges   Connect to Elements publication management system Go to link with your DU access privileges     Unless expressly stated otherwise, the copyright for items in DRO is owned by the author, with all rights reserved. Versions Version Filter Type Wed, 11 May 2022, 08:19:28 EST Wed, 11 May 2022, 16:04:13 EST Tue, 05 Jul 2022, 12:09:07 EST Tue, 05 Jul 2022, 16:07:17 EST Thu, 07 Jul 2022, 13:21:53 EST Thu, 07 Jul 2022, 14:37:45 EST Thu, 07 Jul 2022, 14:45:14 EST Filtered Full Citation counts:   Cited 0 times in TR Web of Science Cited 0 times in Scopus Search Google Scholar Access Statistics: 7 Abstract Views, 1 File Downloads  -  Detailed Statistics Created: Tue, 05 Jul 2022, 12:09:06 EST